Analysis
Data Reduction Guide 鈥� Understanding听 EPMA Analytical Results
- The goal of data reduction
- The ZAF Model for Correction of Matrix Effects Upon Measured X-ray Intensities
- Accuracy and Precision
- Categorization of the types of errors affecting accuracy and precision
- Systematic Errors听
- Physical Standard and sample errors
- Procedural errors
- Counting statistics
- Probe for EPMA
- References
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(PDF - 1.3 MB)
Services Offered
The Dalhousie EPMA offers several services to our valued clients, as follows:
- State-of-the-art quantitative and qualitative analysis using both onboard JEOL software and external Probe for EPMA (PfE)鈩� software provided by ProbeSoftware Inc.
- High-resolution, X-ray compositional mapping using the JEOL software package
- High-resolution electron-imaging in secondary, back-scattered and topographic mode; low-resolution cathodoluminescence imaging
- Training on both the JEOL and Probe for EPMA (PfE)鈩� software packages
- Remote data analysis via Probe for EPMA (PfE)鈩� software, downloaded directly from the ProbeSoftware Inc. website
- Thin section preparation coordinated through Dalhousie鈥檚 Thin Section Lab
- Carbon-coating of samples to be imaged or analysed using the microprobe
- In Development* 鈥� Remote usage of the JXA-8200 with online, live-time technical training and support听听听听
- In Development*听鈥� Remote teaching 鈥� the ability of educators to use the microprobe for teaching purposes, especially important to schools that don鈥檛 have an on-site microprobe of their own
- In Development*听鈥� Remote, live-time, conferenced demonstrations for corporate and other business clients 鈥� e.g., the ability of corporate clients to show investment potential to stakeholders
听听听听听听听听听听听听听听听听听听 *听 Please contact Dan MacDonald if you are interested in testing these applications
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